Inline and offline inspection equipment
for thin film solar layers and stacks
NXT has developed a product group to check both inline and offline all types of layers which are currently used for any type of TFS stack, besides inorganic also including organic layers for future solar applications.
Based on 15 years experience in thin-film testing, special optical components have been designed to guarantee highest precision of the spectral reflectance/transmittance which are needed for precise, reliable and fast testing of layer thickness and n&k.
Principle of Measurement
After recording the spectra of the sample, a mathematical calculation is performed in which the layer thicknesses and the parameters for the optical properties n&k are varied until model and measurement match perfectly.
Inline Control of Thin Film Solar Cells
Thin film solar cells will offer a wide range of alternatives with high potential for increasing efficiency and production yield. Both need the support of inspection equipment to keep any component under check 24h each day. Control of physical parameters like absolute layer thickness and material properties are fundamental for excellent cell performance.
Special optical design of the inspection device is essential to provide accurate spectral measurements in reflectance and transmittance, from which the thicknesses are determined in fast speed.
TFS inline measurements
Highlights of Xelas INLINE-tfs
- TCO layers of any kind
- a-Si/µc-Si layers and stacks
- CIS/CIGS stacks
- CdTe based systems
- Organic solar cells
- Special design of both R- and T-head for highest value stability with respect to height and tilt tolerances
- Automatic internal calibration
- Contactless and non-destructive
- Fast measurement speed