In-line Quality Control of Web Coatings
The ETA-TCM Inline is a modular spectroscopic measurement system for in-line thickness measurements of thin films. The web coating process can be tightly controlled thanks to accurate measurement of film thickness and rapid availability of measuring data.
Simple integration and multi process capability
The design of the ETA-TCM Inline system allows simple integration into production lines, while the software provides advanced communication capabilities suited for web productions.
The ETA-TCM Inline system is based on a modular spectrometer system which can be customized for each measurement task and process. Thin films with a thickness of 150 nm up to 1300000nm (1.3mm) can be measured up to a line speed of about 50 m/min.
For inline / offline spectral measuring for coatings on foils / WEB and on large sizes glasses
For inline / offline control of thin film solar cells
For inline / offline monitoring of reflectance and thickness
Fast and precise measuring system for ophthalmic Anti-Reflection and hard coatings