Inline systems and offline equipment for both production control and development of OLED layers and stacks.
Offline and Inline thin film and reflectance properties and camera based solutions for wafer based solar cells.
Thin Film Competencies
Spectral Offline and Inline Measuring Systems, for thin film characterization in a wide layer thickness range, including coatings on foils/WEB, on large size glasses, on curved surfaces and including microscopic measurements.
For more than 20 years, our measurement instruments have ensured that customers around the world can meet exacting quality standards.
We develop and manufacture spectrometric measurement systems for industrial and laboratory applications. We provide comprehensive, cost-effective quality assurance solutions to leading developers and manufacturers in industries ranging from production of flat-panel displays, precision glass and semiconductors to packaging and coating for consumer products.
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